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Dr. Jacob Abraham, professor of electrical and computer engineering, received the Best Paper Award at the 24th Institute of Electrical and Electronics Engineers’ (IEEE) Very-Large Scale Integration (VLSI) Test Symposium (VTS). The paper “Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits,” written by Abraham and graduate students Hongjoong Shin and Byoungho Kim, discusses problem-solving methods for testing mixed-signal circuits. Abraham holds the Cockrell Family Regents Chair in Engineering No. 8.